The UPC Chip Chair and Datatec Instruments examine the latest innovations in test and measurement for microelectronics

Under the coordination of Jordi Salazar (Director of the Chip Chair) and Albert Albó (Datatec Instruments), on April 29, 2026, Building B3 of the North Campus will host the Microelectronics Test & Measurement Day.

This technical conference is a unique opportunity to learn first-hand about the most advanced measurement technologies, critical tools for overcoming current challenges in the design and manufacturing of semiconductors.

The session will begin with an introduction to DC on-wafer characterization of semiconductor devices by Michael Billaud (Keithley/Tektronix), who will demonstrate the potential of the Keithley 4200-SCS parameter analyzer. Germán Martín (Datatec Instruments) and Fabrizio Cagnin (MPI Corporation) will then delve into the fundamentals of characterization for emerging technologies such as SiC/GaN and silicon photonics (SiPh) using MPI test stations. The event will also focus on cutting-edge practical solutions, with a presentation by Kenza Ghefir and David Sierra (Tektronix) on innovations in power measurement and sequence analysis with state-of-the-art oscilloscopes. The day will include a session on EMC pre-conformance testing with emiGO software, by Jordi Solé and Marc García (EMC Barcelona), and will conclude with an analysis by Daniel Puentes (Datatec Instruments) on new trends in the instrumentation ecosystem for 2026.

This highly specialized day, which will feature live demonstrations of Tektronix and MPI equipment, is offered without a registration fee to engineers from companies and research centers. Access is free but with limited capacity; secure your place by registering now to discover the technologies that define the future of microelectronics