The UPC Chip Chair and Datatec Instruments examine the latest innovations in test and measurement for microelectronics

Organized in collaboration with Datatec Instruments , on April 29, 2026, Building B3 of the North Campus successfully hosted the Microelectronics Test & Measurement Day , a specialized technical conference focused on advanced measurement and characterization technologies for semiconductor devices and microelectronic systems. The event brought together 38 attendees from both academia and industry , generating a highly participatory and high-technical value environment.

The day represented an outstanding opportunity to learn first-hand about the most advanced measurement tools and methodologies, essential to meet today’s challenges in semiconductor design, validation and manufacturing. The session began with the intervention of Michael Billaud (Keithley/Tektronix), who presented the DC on-wafer characterization capabilities using the Keithley 4200-SCS parameter analyzer.

Subsequently, Germán Martín (Datatec Instruments) and Fabrizio Cagnin (MPI Corporation) delved into the fundamentals of characterization applied to emerging technologies such as SiC/GaN and silicon photonics (SiPh), showing different configurations of MPI Corporation’s advanced test stations.

The event also focused on cutting-edge practical solutions for industrial and research environments. In this context, Kenza Ghefir and David Sierra (Tektronix) presented innovations in power measurement and sequence analysis using state-of-the-art oscilloscopes. Then, Jordi Solé and Marc García (EMC Barcelona) presented tools and methodologies for EMC pre-conformance testing using emiGO software. Finally, Daniel Puentes (Datatec Instruments) closed the day with an analysis of the main trends and evolutions of the instrumentation ecosystem expected for 2026.

During the day, attendees were able to participate in live demonstrations of advanced equipment from Tektronix and MPI Corporation, which allowed them to complement the theoretical content with practical experiences applied to real cases.

The technical quality of the presentations, together with the high level of interaction and debate generated between speakers and participants, consolidated this conference as a relevant meeting point for professionals, researchers and students interested in the test and measurement technologies that will define the future of microelectronics.